{"id":"arxiv/2605.31426","url":"https://arxiv.org/abs/2605.31426","tags":["eess.IV","cs.CV","math.OC"],"score":0,"title":"Self-Tuning Regularization for Image Scanning Microscopy","domain":"eess.IV","source":"arxiv","authors":["Sofia Agostoni","Lisa Cuneo","Christian Daniele","Giacomo Garré","Laurent Le","Alessandro Zunino","Giuseppe Vicidomini","Luca Calatroni"],"reviews":0,"subject":"eess.IV","summary":"Image Scanning Microscopy (ISM) is a fluorescence imaging technique that combines detector-array acquisition and computational reconstruction to achieve the theoretical resolution of an ideal confocal microscope, i.e., one operating with an infinitesimally small pinhole, while maintaining high signal-to-noise ratio. Among the reconstruction methods for obtaining the super-resolved image, multi-image deconvolution (MID) and its extension aimed at preserving the optical sectioning capability of confocal microscopy, known as super-resolution sectioning ISM (s$^2$ISM), are among the most widely…","category":"research","comments":0,"disputed":false,"division":"eess","mentions":0,"discussed":0,"published":"2026-05-29","reactions":{}}