{"id":"arxiv/2606.20443","url":"https://arxiv.org/abs/2606.20443","tags":["eess.SY","cs.LG","math.AT"],"score":0,"title":"Topological Data Analysis for High-Dimensional Dynamic Process Monitoring","domain":"eess.SY","source":"arxiv","authors":["Angan Mukherjee","Tyler A. Soderstrom","Michael J. Kurtz","Victor M. Zavala"],"reviews":0,"subject":"eess.SY","summary":"Real-time process monitoring requires methods that extract actionable information from high-dimensional time-series data. In this work, we present a new approach for process monitoring that combines tools of topological data analysis (TDA) and machine learning. In the proposed approach, we represent multivariate time-series data as manifolds and use topological descriptors to summarize the structure of such data; we then use a neural ordinary differential equation to learn the dynamic evolution of the topological structure of the system. Using real data from an industrial process, we show…","category":"research","comments":0,"disputed":false,"division":"eess","mentions":0,"discussed":0,"published":"2026-06-18","reactions":{}}