{"id":"arxiv/2607.12245","url":"https://arxiv.org/abs/2607.12245","tags":["cs.CV","cs.LG","math.PR"],"score":0,"title":"Rough Path Signature-Guided Geometry Augmentation for Few-Shot Industrial Surface Defect Detection","domain":"cs.CV","source":"arxiv","authors":["Jiaqi Kuang"],"reviews":0,"subject":"cs.CV","summary":"Few-shot industrial defect detection remains difficult for standard supervised detectors, which achieve poor performance on boundary-dominated industrial defects. This paper proposes rough path signature-guided geometry augmentation (RPS-GA), a geometry-aware approach in which Canny edge contours are treated as ordered planar paths whose truncated second-order signature responses, especially the antisymmetric Lévy-area term, are aggregated into a spatial map that highlights boundary-related structure through two fusion operators, SIG-AUG and SGAA. The approach is evaluated on NEU-DET and…","category":"research","comments":0,"disputed":false,"division":"cs","mentions":0,"discussed":0,"published":"2026-07-14","reactions":{}}