{"id":"arxiv/2609.24709","url":"https://arxiv.org/abs/2609.24709","tags":["physics.app-ph","physics.optics","quant-ph"],"score":0,"title":"Pendellösung length-scale neutron and X-ray interferometry","domain":"physics.app-ph","source":"arxiv","authors":["Owen Lailey","Alexandre Boutot","David G. Cory","Joseph P. Cotter","Vishal Dhamgaye","Tao Hong","Michael G. Huber","Young-June Kim","Winfried Kockelmann","Jeremy W. Paster","Dusan Sarenac","Kawal Sawhney","Naume Shentevski","Ivar Taminiau","Dmitry A. Pushin"],"reviews":0,"subject":"physics.app-ph","summary":"Neutron and X-ray perfect-crystal interferometers (PCIs) are powerful platforms for studies of fundamental physics and phase-contrast imaging. Further enhancing several PCI capabilities requires reducing crystal blade thickness to the micron scale, which minimizes dynamical-diffraction image blur, permits operation in the pendellösung regime where blade thickness controls beam splitting, and reduces absorption for simultaneous neutron and X-ray operation. However, fabricating multiple crystal blades with identical micrometer-scale thicknesses over centimeter-scale areas remains a major…","category":"research","comments":0,"disputed":false,"division":"physics","mentions":0,"discussed":0,"published":"2026-09-21","reactions":{}}