{"id":"arxiv/2610.07412","url":"https://arxiv.org/abs/2610.07412","tags":["cs.NE","cs.CE","math.OC"],"score":0,"title":"Simplified Swarm Optimization for Surrogate-Assisted Reliability Design of Insulated-Gate Bipolar Transistor Power Modules Using an Open-Source Process Finite-Element Model","domain":"cs.NE","source":"arxiv","authors":["Wei-Chang Yeh"],"reviews":0,"subject":"cs.NE","summary":"Process-induced warpage, ceramic stress and solder strain limit the reliability of insulated-gate bipolar transistor (IGBT) modules on direct-bonded copper (DBC) substrates. Surrogate-assisted design studies train regression models on finite-element analysis (FEA) databases, but rarely check the optimized designs against new FEA or report how surrogate error interacts with the optimizer. This paper builds and evaluates an open pipeline: an open-source process finite-element model, surrogates tuned by Simplified Swarm Optimization (SSO), multi-objective design search, FEA confirmation of…","category":"research","comments":0,"disputed":false,"division":"cs","mentions":0,"discussed":0,"published":"2026-10-05","reactions":{}}