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Mean Testing under Truncation beyond Gaussian

Yuhao Wang, Roberto Imbuzeiro Oliveira, Themis Gouleakis

arXivarxiv/2605.01335May 2, 2026stat.MLscore 0

We characterize the fundamental limits of high-dimensional mean testing under arbitrary truncation, where samples are drawn from the conditional distribution $P(\cdot \mid S)$ for an unknown truncation set $S$ that may hide up to an $\varepsilon$-fraction of the probability mass. For distributions with $p$-th directional moments of magnitude at most $ν_{P,p}$, truncation induces a bias of order $O(ν_{P,p}\varepsilon^{1-1/p})$. This bias creates a sharp information-theoretic detectability floor: when the signal $α$ falls below this threshold, the null and alternative hypotheses are…

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