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A Stein Characterization-type Omnibus Tests for the Discrete Pareto Distribution

Deepesh Bhati, Bruno Ebner, Sakshi Khandelwal

arXivarxiv/2605.05744May 7, 2026stat.MEscore 0

The discrete Pareto (or Zeta, Zipf) distribution, arises naturally in modeling rank-frequency data across diverse fields such as linguistics, demography, biology, and computer science. Despite its widespread applicability, goodness-of-fit testing for the discrete Pareto distribution remains underdeveloped, particularly in the presence of heavy tails and infinite support. This article introduces a novel goodness-of-fit test based on a new Stein-type characterization of the discrete Pareto distribution, formulated using its probability generating function. The proposed method is applicable…

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