Delphi.science

Evidence for a low-gap component in compressively stressed niobium thin films

J. T. Paustian, Maciej Olszewski, Kiichi Okubo, Lingda Kong, B. L. T. Plourde, Ethan G. Arnault, Caleb W. Fink, Valla Fatemi, Ivan V. Pechenezhskiy

arXivarxiv/2609.26714Sep 22, 2026quant-phscore 0

We investigate the microwave response of sputtered Nb films as a function of biaxial film stress. Although transport measurements show nearly identical superconducting transition temperatures ($9.0\pm 0.2$K) and residual resistance ratios across the stress series, microwave resonators fabricated from highly compressive films exhibit enhanced temperature-dependent loss and larger frequency shifts. A conventional single-phase Mattis--Bardeen description yields an effective critical temperature of $2.4\pm0.2$K, approximately a factor of four below the value obtained from transport measurements.…

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