Single-shot coherent process tomography and mid-infrared polarimetry with undetected photons
Measurements with undetected photons infer properties of a probe beam that is never detected, transferring mid-infrared information onto silicon-friendly wavelengths. Tomography in this paradigm has so far relied on switched settings or scanned phases, referenced across a drift-sensitive campaign; no protocol reads all Jones parameters from one frame. We show that a folded nonlinear interferometer with a diagonally pumped crossed-crystal source performs coherent process tomography of the undetected beam in a single spectrometer frame: it reconstructs all seven parameters of the beam's…
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