Efficient Estimation of Logical Sensitivities Through Fault-Counting

Winston Fu; J. Wilson Staples; Jeff D. Thompson

Efficient Estimation of Logical Sensitivities Through Fault-Counting

Winston Fu, J. Wilson Staples, Jeff D. Thompson

arXivarxiv/2610.10531Oct 7, 2026quant-phscore 0

Quantum error-correcting circuits are affected by multiple physical noise mechanisms, whose contributions to logical failure must be understood to evaluate code performance and guide improvements in hardware. The individual error budget contributions for an error type $i$ can be characterized by its logical sensitivity $ν_i = \frac{\partial p_L}{\partial p_i}$, which measures the response of the logical error rate $p_L$ to each physical noise parameter $p_i$. Normally, $ν_i$ is measured using linear fits such as finite differences, where $p_L$ is measured at two or more values of $p_i$ to…

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