Quantum annealing of the random transverse-field Ising model in one, two, and three dimensions
Quantum annealing must be sufficiently slow to prevent defect formation. We study this problem in the random transverse-field Ising model via the adiabatic theorem to obtain the limiting rate at which defect formation can be avoided. Our approach based on the strong-disorder renormalization group (SDRG) technique views the annealing process as a gradual aggregation of strongly coupled clusters, giving access to the elementary events of error formation. We present a scaling theory of the statistics of these events in general dimensions and confront it to an extensive numerical analysis…
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