Competing Fault Histories in Lattice-Surgery Decoding
Different physical faults can produce the same detector record while carrying opposite logical labels. We investigate the consequence of this ambiguity for a lattice surgery parity measurement. In a distance-three merge--split circuit, single-gate faults compete with reset/readout pairs on three complete syndromes. Full-syndrome probabilities give a simultaneous 95\% lower confidence bound of $16.64$ parts per million on the cost of retaining the selected single-fault decisions at one noise point. Changing those decisions is harmful at low noise and beneficial at higher noise. To test the…
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